In: Practical methods in electron microscopy, vol.2 (ed. 11, 185–189 (1960).Īgar, A.W., Alderson, R.H., Chescoe, D.: Principles and practice of electron microscope operation. This process is experimental and the keywords may be updated as the learning algorithm improves.Īgar, A.W.: Accuracy of selected-area microdiffraction in the electron microscope. These keywords were added by machine and not by the authors. Correlation of both sources of data can therefore yield information not available from either technique alone. d-spacings and intensities measured on X-ray patterns are, however, generally more accurate and reliable than electron-diffraction data. Alternatively, electron diffraction of polycrystalline platy textures can sometimes be used, both to determine the unit cell and to provide indexed intensity data for use in structure analysis. However, electron diffraction of small single crystals can be used for determination of the unit cell, enabling the X-ray lines to be indexed. In such cases, determination of the unit cell from X-ray data alone can be difficult or impossible, because of failure to resolve multiple reflections or to detect weak ones on polycrystalline X-ray photographs, together with uncertainties about systematically absent reflections. Many minerals and synthetic inorganic phases of low symmetry occur only as fine powders or fibre aggregates.
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